DIC Module: Differential Interference Contrast. With the redesign of the DIC module, the visualization of height differences that cannot normally be visualized with brightfield techniques has been significantly improved. All objectives designed for incident light with infinity correction are adequate for the micro range. When DIC is used with reflected light, the surface geometry can often be interpreted as a true three-dimensional representation. It provides a clear distinction between raised and depressed areas in the sample. These relief images are ideal for surface inspection of wafers, LCD screens, etc.