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Cutting-edge technology for demanding materials science applications. The ergonomic design and outstanding modern objectives make the Delphi-X Observer the ideal microscope for demanding materials science applications. The 25 mm field of view of the eyepieces and the planapochromatic objectives allow observations with perfect color reproduction and high resolution. The Delphi-X Observer™ comes standard with BD 5x/0.15 BD 20 mm, 10x/0.30 WD 11 mm, and 20x/0.45 WD 3.1 mm planapochromatic objectives, and BD 50x/0.80 WD 1 mm and 100x/0.90 WD 1 mm planapochromatic objectives with infinity correction for brightfield/darkfield.
The Extended Infinity System (EIS) of the Delphi-X Observer™ consists of super wide-angle SFWF eyepieces (10x/25 mm), high numerical aperture parfocal objectives (45 mm) and a 200 mm focal length tube objective. The 200 mm focal length tube objective reduces the angle of light rays passing through the optics. This results in a significant improvement in color error correction and contrast. The larger diameter lenses have a much higher numerical aperture, improving the overall resolving power of the optical system. With all these features, the Delphi-X Observer™ offers outstanding optical performance for demanding applications.
Delphi-X Observer with Plan Semi-Apochromatic and Plan Apochromatic objectives with infinity correction for brightfield and darkfield
Plan PLi 2x/0.06 infinity corrected objective, working distance 7.5 mm
Infinity EIS 45 mm Plan semi-apo SAMi 100x/0.90 objective. Working distance 1 mm. No cover glass correction. M26 thread
C-Mount adapter with high resolution optics for chip sizes 1/3, 1/2" and 2/3" cameras for Delphi-X Observer
The DIC module significantly improves the visualization of height differences that cannot normally be visualized with brightfield techniques
To avoid side glare these eyecups are used for the eyepieces of the Delphi-X series